WBG power electronics – new JEDEC guidelines

There is JEP203: Guideline for Short Circuit Evaluation in Power Conversion Transistors. And JEP204: Catalog of Stress Procedures for Silicon Carbide Devices for Power Electronic Conversion. Both were developed by the standards organisation’s JC-70.2 Silicon Carbide Subcommittee.

Applications for WBG power semiconductors span from automotive to space electronics. And Jedec highlights the need for standardisation in this area.

JEP203

JEP203 provides guidance for evaluating short-circuit capability of power MOSFETs.

The aim is to help engineers improve protection design, testing consistency, and system robustness. For example in applications such as electric vehicles, industrial drives, and energy infrastructure.

JEP204

Similarly, JEP204 is a comprehensive reference covering reliability, environmental, and ruggedness stress procedures for SiC power devices.

According to the Solid State Technology Association, the publication gives qualification engineers and device manufacturers a common framework for evaluating long-term reliability and performance.

WBG

“JEP203 and JEP204 are landmark guidelines for SiC power conversion, enabling the industry to confidently adopt silicon carbide in demanding power electronic applications,” said Dr. Donald Gajewski, Wolfspeed Senior Director Reliability Engineering. “JEP204, in particular, provides a comprehensive framework of best practices for stressing SiC power devices, offering significant value to both users and suppliers.”

“Together, these documents reflect years of industry collaboration and mark a historic milestone in advancing the reliability, safety, and standardization of SiC technology.”

JEP203 and JEP204 are available as free downloads from the JEDEC website.

Image: Infineon Silicon carbide CoolSiC MOSFETs

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